10th Edition of IEEE International Test Conference India 2026 has concluded.

10th Edition of IEEE International Test Conference India 2026

4.8Paid entry
  • 19–21 Jul 2026
  • 9:00 AM – 6:00 PM
  • RADISSON BLU, Bengaluru
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19 Jul-21 Jul09:00 AM - 06:00 PM

RADISSON BLU

90/4, Outer Ring Rd, Marathahalli Village, Marathahalli, Bengaluru, Karnataka 560037, India

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Why visit

50+stalls to explore

  • Technical sessions on advanced DFT and test automation
  • Keynotes from global semiconductor industry leaders
  • Made for test Engineers, Semiconductor Professionals and Researchers

Why exhibit

1,000+visitors expected

  • Meet test Engineers, Semiconductor Professionals and Researchers
  • Every visitor you scan lands in your exhibitor panel, ready to follow up
  • 10th edition, an established show
Overview

About this Event

9 hrsDuration
PaidEntry Fees
ConferenceEvent Type
1000+Estimated Turnout
50+Stalls
10thEvent Edition

The 10th edition of the IEEE International Test Conference (ITC) India continues to be the primary forum for experts to discuss the challenges and solutions in testing, silicon lifecycle management, and reliability. The event brings together industry leaders, academic researchers, and test engineers to share insights on emerging technologies, design-for-test (DFT), and advanced silicon manufacturing test processes.

  • Technical sessions on advanced DFT and test automation.
  • Keynotes from global semiconductor industry leaders.
  • Exhibition showcasing the latest test equipment and software tools.

Organiser

Organised by

Itc Semiconductor Industry Society

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Industries

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